Instruments

  • AFM

  • ION CHROMATOGRAPHIC

  • XRD

  • NMR

  • SEM

  • UV-NIR-VIS

ATOMIC FORCE MICROSCOPY (AFM)

Description

Instrument : Atomic Force Microscope
Both contact and tapping modes are available.
Scanner —100 μm


Applications

Testing capabilities:
  • surface morphology

  • particle size

  • roughness of the samples and 3D and 2D images


Sample Specification

  • Thin Films : Thickness up to 3 mm, Diameter 1 cm

  • Metals : Thickness up to 3 mm, Diameter 1 cm

  • If the sample in powder form spread it thinly on a microscope slide using a drop of acetone (to be done by the user).

  • Tooth : Thickness and diameter below 1 cm

Limitations

Direct liquid samples and powder samples cannot be tested

ION CHROMATOGRAPHIC SYSTEM (IC)

Description

Instrument : Dionex ICS-1100 Ion Chromatographic System with degas (Isocratic)
Maximum Operating Pressure: 35MPa (5000psi)
Flow Rate Range: 0.05-5.0 mL/min in 0.01 increments
Flow Precision: <0.2%
Flow Accuracy: <1.0% from 0.4 to 2.0mL/min at 1000-3000psi
Resolution of conductivity detector: 0.1 nS
Sample holders : 50 polyvials of 5mL size

Air conditioned (21 to 24 degree C) ; Relative humidity is less than 60 % ; Nitrogen with 99.99% purity, regulator (0-1 bar control)


Applications

Testing capabilities:
  • Major cations like Sodium, Potassium, Calcium, Magnesium and Ammonium can be identified and quantified.

  • Major anions like Fluoride, Chloride, Nitrate, Phosphate and Sulphate can be identified and quantified.


Types of samples for analysis:
  • Water Sample – Groundwater, Surface water, Rainwater, Packaged drinking water.


Sample Specification

  • Water samples need to be filtered through a filter of pore size 0.20µm

  • Conductivity of the water sample should be within 120µS.

  • Conductivity should be lowered by dilution if the sample conductivity exceeds 120µS.


Limitations

Waste water and chemically treated water/solution cannot be tested

X-RAY DIFFRACTROMETER (XRD)

Description

Instrument : Rigaku Miniflex 600 (5th gen )
> X-ray generation – up to 40 kV & current(15 mA)
> Temperature range - near room temperature measurement with an up gradation of high temperature measurement
> Samples – Both bulk and thin films sample measurement.
> Filters – Nickel filter.
> Wide angle measurement (50-130 ) 2 theta value.


Applications

Testing capabilities:
qualitative and quantitative analysis of polycrystalline materials

Phase identification and quantification
  • Percent (%) crystallinity

  • Crystallite size and strain

  • Lattice parameter calculation




Sample Specification

Types of samples for analysis:
  • Powder: 15 - 20 mg

  • Thin Films: Thickness 2mm, diameter 2 cm.

  • Metals: Thickness 2mm, diameter 2 cm.


Limitations

Samples such as Liquid samples cannot be tested

NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY (NMR)

Description

Make: Bruker Ascend 400 MHz
Testing capabilities: 1H NMR, 13C NMR, 31P NMR, DEPT & HSQC-GP.

Applications

Organic samples

Sample Specification

Solid / liquid samples should be soluble in DMSO/CDCl3/D2O (mainly organic compounds):
Quantity of Sample required
  • Carbon NMR – 10 - 15mg

  • Proton NMR - 5mg



Limitations

Solid samples such as Metals cannot be tested

SCANNING ELECTRON MICROSCOPE (SEM)

Description

Instrument : EVO MA18 with Oxford EDS(X-act)

Magnification: Minimum 1x and maximum 1,00,000x

EDS : Liquid nitrogen free

Sample holders : 9 sample holders

Depth of focus: At a magnification of 1000x, aperture size of 100 microns and working distance of 10 mm should be 40 microns

Air conditioned (21 to 24 degree C) ; Relative humidity is less than 60 % ; Nitrogen with 99.99% purity, regulator (0-3 bar control)  


Air conditioned (21 to 24 degree C) ; Relative humidity is less than 60 % ; Nitrogen with 99.99% purity, regulator (0-3 bar control)


Applications

Testing capabilities:

  • Topographic imaging of materials .

  • Measurement of thickness of the samples

  • Identification of elements from carbon upwards using energy dispersive X-ray analysis

  • Grain size measurement 


Types of samples for analysis:


  • Non-Conductive samples

    • Biological Samples (like plant material, Bacteria, Tooth, wood etc.,)

    • Insulating Samples (like Glass, Ceramic, Plastic etc.)

    • Polymer/Membranes

    • Thin Film Samples

  • Semi-Conductive samples
    • Silicone

  • Conductive samples

    • Metals, alloys

Powder sample in pellet form



Sample Specification


  • Size : Diameter /height /thickness : 5- 6 mm

  • Dry samples

UV-VIS-NIR-SPECTROPHOTOMETER

Description

Wavelength range: 200 nm-3100 nm.
Temperature range: near room temperature.
Desired resolution: less than 0.05 nm.
Mode of operation: Reflection, transmission, absorption


Applications

Testing capabilities:

Optical transmittance, Reflectance, Absorption of solutions, thin films and thick films.

Sample Specification

  • Thin Films: Thickness 2 – 3 mm, Length/Diameter 2.5cm for Absorbance and Transmittance

  • Thin Films: Thickness 2 – 3 mm, Length/Diameter 3.5cm for Reflectance

  • Liquid Samples: 15ml.

  • User should bring the empty glass slide as reference .


Limitations

Direct powder samples and metals samples such as Metals cannot be tested

NIKON OPTICAL MICROSCOPE LV 100

Description

Resolution: Up to 500nm

Modes of operation:
o Transmission mode
o Reflection mode (for opaque samples)


Applications

All material which are in the thin film form on planar substrate.

o Micron size pore can be analysed.
o Biological samples like proteins, bacteria can be clearly seen


Sample Specification

  • Sample should be on planar solid surface (Glass).

  • Sample should be ‘dry’


Limitations

Flexible, liquid and power samples less than 500nm cannot be examined.